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Characterization of Oxide Films on SiC Epitaxial (0001) Faces by Angle-Resolved Photoemission Spectroscopy Measurements Using Synchrotron Radiation
Characterization of Oxide Films on SiC Epitaxial (0001) Faces by Angle-Resolved Photoemission Spectroscopy Measurements Using Synchrotron Radiation
Characterization of Oxide Films on SiC Epitaxial (0001) Faces by Angle-Resolved Photoemission Spectroscopy Measurements Using Synchrotron Radiation
Hijikata, Y. (author) / Yaguchi, H. (author) / Yoshida, S. (author) / Takata, Y. (author) / Kobayashi, K. (author) / Shin, S. (author) / Nohira, H. (author) / Hattori, T. (author) / Nipoti, R. / Poggi, A.
2005-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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