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    Electrical Characteristics of 4H-SiC BJTs at Elevated Temperatures

    New search for: Lee, H. S.
    New search for: Domeij, M.
    New search for: Danielsson, E.
    New search for: Zetterling, C. M.
    New search for: Ostling, M.
    New search for: Nipoti, R.
    New search for: Poggi, A.
    New search for: Scorzoni, A.

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    Electrical Characteristics of 4H-SiC BJTs at Elevated Temperatures

    New search for: Lee, H. S.
    New search for: Domeij, M.
    New search for: Danielsson, E.
    New search for: Zetterling, C. M.
    New search for: Ostling, M.
    New search for: Nipoti, R.
    New search for: Poggi, A.
    New search for: Scorzoni, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Electrical Characteristics of 4H-SiC BJTs at Elevated Temperatures

    New search for: Lee, H. S.
    New search for: Domeij, M.
    New search for: Danielsson, E.
    New search for: Zetterling, C. M.
    New search for: Ostling, M.
    New search for: Nipoti, R.
    New search for: Poggi, A.
    New search for: Scorzoni, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Electrical Characteristics of 4H-SiC BJTs at Elevated Temperatures

    Contributors:

    Lee, H. S. (author) / Domeij, M. (author) / Danielsson, E. (author) / Zetterling, C. M. (author) / Ostling, M. (author) / Nipoti, R. / Poggi, A. / Scorzoni, A.

    Published in:

    Silicon Carbide and Related Materials 2004 ; 897-900

    MATERIALS SCIENCE FORUM ; 483/485

    Publication date:

    2005-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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