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    Influence of oxygen and post deposition annealing on the electrical properties of MnPc and MnPcCl Schottky barrier devices

    New search for: Rajesh, K. R.
    New search for: Menon, C. S.

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    Influence of oxygen and post deposition annealing on the electrical properties of MnPc and MnPcCl Schottky barrier devices

    New search for: Rajesh, K. R.
    New search for: Menon, C. S.

    Access

    Access via TIB
    Check availability in my library
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    Influence of oxygen and post deposition annealing on the electrical properties of MnPc and MnPcCl Schottky barrier devices

    New search for: Rajesh, K. R.
    New search for: Menon, C. S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Title:

    Influence of oxygen and post deposition annealing on the electrical properties of MnPc and MnPcCl Schottky barrier devices

    Contributors:

    Rajesh, K. R. (author) / Menon, C. S. (author)

    Published in:

    JOURNAL OF MATERIALS SCIENCE ; 40 ; 1115-1120

    Publication date:

    2005-01-01

    Size:

    6 pages

    ISSN:

    0022-2461

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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