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    Characterization of Long-Term Oxidized Nickel Aluminide Coating by Photoluminescence Spectroscopy

    New search for: Byeon, J. W.
    New search for: Mu, N.
    New search for: Liu, J.
    New search for: Sohn, Y. H.
    New search for: Kim, H. S.
    New search for: Park, S.-Y.
    New search for: Hur, B. Y.
    New search for: Lee, S. W.

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    Characterization of Long-Term Oxidized Nickel Aluminide Coating by Photoluminescence Spectroscopy

    New search for: Byeon, J. W.
    New search for: Mu, N.
    New search for: Liu, J.
    New search for: Sohn, Y. H.
    New search for: Kim, H. S.
    New search for: Park, S.-Y.
    New search for: Hur, B. Y.
    New search for: Lee, S. W.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Characterization of Long-Term Oxidized Nickel Aluminide Coating by Photoluminescence Spectroscopy

    New search for: Byeon, J. W.
    New search for: Mu, N.
    New search for: Liu, J.
    New search for: Sohn, Y. H.
    New search for: Kim, H. S.
    New search for: Park, S.-Y.
    New search for: Hur, B. Y.
    New search for: Lee, S. W.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Characterization of Long-Term Oxidized Nickel Aluminide Coating by Photoluminescence Spectroscopy

    Contributors:

    Byeon, J. W. (author) / Mu, N. (author) / Liu, J. (author) / Sohn, Y. H. (author) / Kim, H. S. / Park, S.-Y. / Hur, B. Y. / Lee, S. W.

    Published in:

    Eco-Materials Processing & Design VI ; 141-144

    MATERIALS SCIENCE FORUM ; 486/487

    Publication date:

    2005-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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