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XRD Stress Analysis in a TiAl Based Intermetallic Multicrystal
XRD Stress Analysis in a TiAl Based Intermetallic Multicrystal
XRD Stress Analysis in a TiAl Based Intermetallic Multicrystal
Seiler, W. (author) / Hoel, G. (author) / Thomas, M. (author) / Ji, V. (author) / Denis, S. / Hanabusa, T. / He, B. / Mittemeijer, E. / Nan, J. / Noyan, I. C.
2005-01-01
6 pages
Article (Journal)
English
DDC:
620.11
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