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    Advances in Micro and Nano-Scale Surface Metrology

    New search for: Blunt, L.
    New search for: Jiang, X.
    New search for: Scott, P. J.
    New search for: Gao, Y.
    New search for: Tse, S.
    New search for: Gao, W.

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    Advances in Micro and Nano-Scale Surface Metrology

    New search for: Blunt, L.
    New search for: Jiang, X.
    New search for: Scott, P. J.
    New search for: Gao, Y.
    New search for: Tse, S.
    New search for: Gao, W.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Advances in Micro and Nano-Scale Surface Metrology

    New search for: Blunt, L.
    New search for: Jiang, X.
    New search for: Scott, P. J.
    New search for: Gao, Y.
    New search for: Tse, S.
    New search for: Gao, W.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Advances in Micro and Nano-Scale Surface Metrology

    Contributors:

    Blunt, L. (author) / Jiang, X. (author) / Scott, P. J. (author) / Gao, Y. / Tse, S. / Gao, W.

    Published in:

    Measurement Technology and Intelligent Instruments VI ; 431-436

    KEY ENGINEERING MATERIALS ; 295/296

    Publication date:

    2005-01-01

    Size:

    6 pages

    ISSN:

    1013-9826

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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