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    Raman Piezo-Spectroscopic Investigation of Microscopic Residual Stresses in Ni-MLCC Devices

    New search for: Sakashita, T.
    New search for: Nakamura, K.
    New search for: Pezzotti, G.
    New search for: Chazono, H.

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    Raman Piezo-Spectroscopic Investigation of Microscopic Residual Stresses in Ni-MLCC Devices

    New search for: Sakashita, T.
    New search for: Nakamura, K.
    New search for: Pezzotti, G.
    New search for: Chazono, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Raman Piezo-Spectroscopic Investigation of Microscopic Residual Stresses in Ni-MLCC Devices

    New search for: Sakashita, T.
    New search for: Nakamura, K.
    New search for: Pezzotti, G.
    New search for: Chazono, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
    Title:

    Raman Piezo-Spectroscopic Investigation of Microscopic Residual Stresses in Ni-MLCC Devices

    Contributors:

    Sakashita, T. (author) / Nakamura, K. (author) / Pezzotti, G. (author) / Chazono, H. (author)

    Published in:

    KEY ENGINEERING MATERIALS ; 301 ; 31-36

    Publication date:

    2006-01-01

    Size:

    6 pages

    ISSN:

    1013-9826

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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