Combined Rietveld refinement of CaMgSi2O6:Eu2+ using X-ray and neutron powder diffraction data: Fid-Bau Portal

Combined Rietveld refinement of CaMgSi2O6:Eu2+ using X-ray and neutron powder diffraction data

Kim, Y. I. / Im, W. B. / Jeon, D. Y.

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Combined Rietveld refinement of CaMgSi2O6:Eu2+ using X-ray and neutron powder diffraction data

Kim, Y. I. / Im, W. B. / Jeon, D. Y.

Combined Rietveld refinement of CaMgSi2O6:Eu2+ using X-ray and neutron powder diffraction data

Kim, Y. I. / Im, W. B. / Jeon, D. Y.

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Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Combined Rietveld refinement of CaMgSi2O6:Eu2+ using X-ray and neutron powder diffraction data

Contributors:

Kim, Y. I. (author) / Im, W. B. (author) / Jeon, D. Y. (author)

Published in:

JOURNAL OF MATERIALS SCIENCE ; 41 ; 1643-1647

Publication date:

2006-01-01

Size:

5 pages

ISSN:

0022-2461

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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