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    Surface Residual Stress Measurement Using Curvature Interferometry

    New search for: Wang, J.
    New search for: Shrotriya, P.
    New search for: Kim, K. S.

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    Surface Residual Stress Measurement Using Curvature Interferometry

    New search for: Wang, J.
    New search for: Shrotriya, P.
    New search for: Kim, K. S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Surface Residual Stress Measurement Using Curvature Interferometry

    New search for: Wang, J.
    New search for: Shrotriya, P.
    New search for: Kim, K. S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Surface Residual Stress Measurement Using Curvature Interferometry

    Contributors:

    Wang, J. (author) / Shrotriya, P. (author) / Kim, K. S. (author)

    Published in:

    EXPERIMENTAL MECHANICS ; 46 ; 39-46

    Publication date:

    2006-01-01

    Size:

    8 pages

    ISSN:

    0014-4851

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.1

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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