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    Quality Control in Microelectronics: Metrology Tools Provide Solutions

    New search for: Fries, T.
    New search for: Flynn, P.
    New search for: Lamm, P.

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    Quality Control in Microelectronics: Metrology Tools Provide Solutions

    New search for: Fries, T.
    New search for: Flynn, P.
    New search for: Lamm, P.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Quality Control in Microelectronics: Metrology Tools Provide Solutions

    New search for: Fries, T.
    New search for: Flynn, P.
    New search for: Lamm, P.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Quality Control in Microelectronics: Metrology Tools Provide Solutions

    Contributors:

    Fries, T. (author) / Flynn, P. (author) / Lamm, P. (author)

    Published in:

    ADVANCED PACKAGING ; 15 ; 30-31

    Publication date:

    2006-01-01

    Size:

    2 pages

    ISSN:

    1065-0555

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  658.564

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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