Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    High-resolution photoinduced transient spectroscopy of defect centres in semi-insulating InP obtained by iron diffusion

    New search for: Kaminski, P.
    New search for: Kozlowski, R.
    New search for: Strzelecka, S.
    New search for: Pawlowski, M.
    New search for: Wegner, E.
    New search for: Piersa, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    High-resolution photoinduced transient spectroscopy of defect centres in semi-insulating InP obtained by iron diffusion

    New search for: Kaminski, P.
    New search for: Kozlowski, R.
    New search for: Strzelecka, S.
    New search for: Pawlowski, M.
    New search for: Wegner, E.
    New search for: Piersa, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    High-resolution photoinduced transient spectroscopy of defect centres in semi-insulating InP obtained by iron diffusion

    New search for: Kaminski, P.
    New search for: Kozlowski, R.
    New search for: Strzelecka, S.
    New search for: Pawlowski, M.
    New search for: Wegner, E.
    New search for: Piersa, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    High-resolution photoinduced transient spectroscopy of defect centres in semi-insulating InP obtained by iron diffusion

    Contributors:

    Kaminski, P. (author) / Kozlowski, R. (author) / Strzelecka, S. (author) / Pawlowski, M. (author) / Wegner, E. (author) / Piersa, M. (author)

    Published in:

    MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 9 ; 384-389

    Publication date:

    2006-01-01

    Size:

    6 pages

    ISSN:

    1369-8001

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.38152

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    High-resolution photoinduced transient spectroscopy as a new tool for quality assessment of semi-insulating GaAs

    Kaminski, P. / Kozlowski, R. | British Library Online Contents | 2002

    Defect Levels in High Purity Semi-Insulating 4H-SiC Studied by Alpha Particle Induced Charge Transient Spectroscopy

    Iwamoto, N. / Onoda, S. / Fujita, N. et al. | British Library Online Contents | 2014

    Positron Deep-Level Transient Spectroscopy in Semi-Insulating-GaAs Using the Positron Velocity Transient Method

    Tsia, M. / Fung, S. / Beling, C. D. | British Library Online Contents | 2001

    Native defect equilibrium in semi-insulating CdTe(Cl)

    Hoeschl, P. / Grill, R. / Franc, J. et al. | British Library Online Contents | 1993

    Characterization of Traps in Semi-Insulating 4H-SiC by Discharge Current Transient Spectroscopy

    Takahashi, M. / Matsuura, H. | British Library Online Contents | 2009

    Back to top