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Nanoindentation measurements of the mechanical properties of polycrystalline Au and Ag thin films on silicon substrates: Effects of grain size and film thickness
Nanoindentation measurements of the mechanical properties of polycrystalline Au and Ag thin films on silicon substrates: Effects of grain size and film thickness
Nanoindentation measurements of the mechanical properties of polycrystalline Au and Ag thin films on silicon substrates: Effects of grain size and film thickness
Cao, Y. (author) / Allameh, S. (author) / Nankivil, D. (author) / Sethiaraj, S. (author) / Otiti, T. (author) / Soboyejo, W. (author)
MATERIALS SCIENCE AND ENGINEERING A ; 427 ; 232-240
2006-01-01
9 pages
Article (Journal)
English
DDC:
620.11
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