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Parameter identification for a TRIP model with backstress

Wolff, M. / Bohm, M. / Dalgic, M. / Lowisch, G. / Lysenko, N. / Rath, J.

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Parameter identification for a TRIP model with backstress

Wolff, M. / Bohm, M. / Dalgic, M. / Lowisch, G. / Lysenko, N. / Rath, J.

Parameter identification for a TRIP model with backstress

Wolff, M. / Bohm, M. / Dalgic, M. / Lowisch, G. / Lysenko, N. / Rath, J.

Access

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Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Parameter identification for a TRIP model with backstress

Contributors:

Wolff, M. (author) / Bohm, M. (author) / Dalgic, M. (author) / Lowisch, G. (author) / Lysenko, N. (author) / Rath, J. (author)

Published in:

COMPUTATIONAL MATERIALS SCIENCE ; 37 ; 37-41

Publication date:

2006-01-01

Size:

5 pages

ISSN:

0927-0256

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.1 / 510

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