Evolution of C-rich SiOC ceramics Part II. Characterization by high lateral resolution techniques: electron energy-loss spectroscopy, high-resolution TEM and energy-filtered TEM: Fid-Bau Portal

Evolution of C-rich SiOC ceramics Part II. Characterization by high lateral resolution techniques: electron energy-loss spectroscopy, high-resolution TEM and energy-filtered TEM

Gregori, G. / Kleebe, H.-J. / Blum, Y. D. / Babonneau, F.

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Evolution of C-rich SiOC ceramics Part II. Characterization by high lateral resolution techniques: electron energy-loss spectroscopy, high-resolution TEM and energy-filtered TEM

Gregori, G. / Kleebe, H.-J. / Blum, Y. D. / Babonneau, F.

Evolution of C-rich SiOC ceramics Part II. Characterization by high lateral resolution techniques: electron energy-loss spectroscopy, high-resolution TEM and energy-filtered TEM

Gregori, G. / Kleebe, H.-J. / Blum, Y. D. / Babonneau, F.

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Check availability in my library

Order at Subito €

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Document information

Title:

Evolution of C-rich SiOC ceramics Part II. Characterization by high lateral resolution techniques: electron energy-loss spectroscopy, high-resolution TEM and energy-filtered TEM

Contributors:

Gregori, G. (author) / Kleebe, H.-J. (author) / Blum, Y. D. (author) / Babonneau, F. (author)

Published in:

INTERNATIONAL JOURNAL OF MATERIALS RESEARCH ; 97 ; 710-720

Publication date:

2006-01-01

Size:

11 pages

ISSN:

1862-5282

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 669.9

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