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Strains in Thermally Growing Alumina Films Measured In Situ Using Synchrotron X-Rays
Strains in Thermally Growing Alumina Films Measured In Situ Using Synchrotron X-Rays
Strains in Thermally Growing Alumina Films Measured In Situ Using Synchrotron X-Rays
Hou, P. Y. (author) / Paulikas, A. P. (author) / Veal, B. W. (author) / Taniguchi, S. / Maruyama, T. / Yoshiba, M. / Otsuka, N. / Kawahara, Y.
2006-01-01
8 pages
Article (Journal)
English
DDC:
620.11
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