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    Fatigue Life Evaluation for Notched Components of Automatic Transfer Devices

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    New search for: Noh, B. W.
    New search for: Ham, K. C.
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    Fatigue Life Evaluation for Notched Components of Automatic Transfer Devices

    New search for: Choi, Y. W.
    New search for: Noh, B. W.
    New search for: Ham, K. C.
    New search for: Bae, S. I.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Fatigue Life Evaluation for Notched Components of Automatic Transfer Devices

    New search for: Choi, Y. W.
    New search for: Noh, B. W.
    New search for: Ham, K. C.
    New search for: Bae, S. I.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Fatigue Life Evaluation for Notched Components of Automatic Transfer Devices

    Contributors:

    Choi, Y. W. (author) / Noh, B. W. (author) / Ham, K. C. (author) / Bae, S. I. (author)

    Published in:

    KEY ENGINEERING MATERIALS ; 324/325 ; 1269-1272

    Publication date:

    2006-01-01

    Size:

    4 pages

    ISSN:

    1013-9826

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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