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Structural and optical characterization of GaN heteroepitaxial films on SiC substrates

Morse, M. / Wu, P. / Choi, S. / Kim, T. H. / Brown, A. S. / Losurdo, M. / Bruno, G.

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Structural and optical characterization of GaN heteroepitaxial films on SiC substrates

Morse, M. / Wu, P. / Choi, S. / Kim, T. H. / Brown, A. S. / Losurdo, M. / Bruno, G.

Structural and optical characterization of GaN heteroepitaxial films on SiC substrates

Morse, M. / Wu, P. / Choi, S. / Kim, T. H. / Brown, A. S. / Losurdo, M. / Bruno, G.

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Document information

Title:

Structural and optical characterization of GaN heteroepitaxial films on SiC substrates

Contributors:

Morse, M. (author) / Wu, P. (author) / Choi, S. (author) / Kim, T. H. (author) / Brown, A. S. (author) / Losurdo, M. (author) / Bruno, G. (author)

Published in:

APPLIED SURFACE SCIENCE ; 253 ; 232-235

Publication date:

2006-01-01

Size:

4 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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