A platform for research: civil engineering, architecture and urbanism
Effects of Rapid Thermal Annealing Treatment on the Surface Band Bending of n-type GaN Studied by Surface Potential Electric Force Microscopy
Effects of Rapid Thermal Annealing Treatment on the Surface Band Bending of n-type GaN Studied by Surface Potential Electric Force Microscopy
Effects of Rapid Thermal Annealing Treatment on the Surface Band Bending of n-type GaN Studied by Surface Potential Electric Force Microscopy
Chevtchenko, S. (author) / Fan, Q. (author) / Litton, C. W. (author) / Baski, A. A. (author) / Morkoc, H. (author) / Devaty, R. P. / Larkin, D. J. / Saddow, S. E.
Silicon Carbide and Related Materials - 2005 ; 1529-1532
MATERIALS SCIENCE FORUM ; 527/529
2006-01-01
4 pages
Article (Journal)
English
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Electric Force Microscopy and Surface Potential Imaging
British Library Online Contents | 2000
|Band bending, surface photovoltage and tunnelling microscopy on WSe~2:Rb
British Library Online Contents | 1998
|Occupation of Surface States and Surface Band-Bending in Thermal Equilibrium
Springer Verlag | 2001
|DNA adsorption and desorption on mica surface studied by atomic force microscopy
British Library Online Contents | 2011
|Surface structure of poly(3-alkylthiophene) films studied by atomic force microscopy
British Library Online Contents | 2002
|