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    Damage-Based Models for Step-Stress Accelerated Life Testing

    New search for: Lee, Y.-L.
    New search for: Lu, M.-W.

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    Damage-Based Models for Step-Stress Accelerated Life Testing

    New search for: Lee, Y.-L.
    New search for: Lu, M.-W.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Damage-Based Models for Step-Stress Accelerated Life Testing

    New search for: Lee, Y.-L.
    New search for: Lu, M.-W.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Damage-Based Models for Step-Stress Accelerated Life Testing

    Contributors:

    Lee, Y.-L. (author) / Lu, M.-W. (author)

    Published in:

    JOURNAL OF TESTING AND EVALUATION ; 34 ; 494-503

    Publication date:

    2006-01-01

    Size:

    10 pages

    ISSN:

    0090-3973

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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