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A Study of Nano-Indentation Test Using Rhombus-Shaped Cantilever in Atomic Force Microscope
A Study of Nano-Indentation Test Using Rhombus-Shaped Cantilever in Atomic Force Microscope
A Study of Nano-Indentation Test Using Rhombus-Shaped Cantilever in Atomic Force Microscope
Cho, K. H. (author) / Lee, H. J. (author) / Kim, J. H. (author) / Kim, J. M. (author) / Kim, Y. K. (author) / Baek, C. W. (author) / Lee, S.-B. / Kim, Y.-J.
2006-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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