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Atomic force microscopy cantilever simulation by finite element methods for quantitative atomic force acoustic microscopy measurements

Beltran, F. J. E. / Munoz-Saldana, J. / Torres-Torres, D. / Torres-Martinez, R. / Schneider, G. A.

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Atomic force microscopy cantilever simulation by finite element methods for quantitative atomic force acoustic microscopy measurements

Beltran, F. J. E. / Munoz-Saldana, J. / Torres-Torres, D. / Torres-Martinez, R. / Schneider, G. A.

Atomic force microscopy cantilever simulation by finite element methods for quantitative atomic force acoustic microscopy measurements

Beltran, F. J. E. / Munoz-Saldana, J. / Torres-Torres, D. / Torres-Martinez, R. / Schneider, G. A.

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Document information

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Document information

Title:

Atomic force microscopy cantilever simulation by finite element methods for quantitative atomic force acoustic microscopy measurements

Contributors:

Beltran, F. J. E. (author) / Munoz-Saldana, J. (author) / Torres-Torres, D. (author) / Torres-Martinez, R. (author) / Schneider, G. A. (author)

Published in:

JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 21 ; 3072-3079

Publication date:

2006-01-01

Size:

8 pages

ISSN:

0884-2914

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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