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The Effects of Oxygen Partial Pressure on Interface States and Ferroelectric Properties of PZT/PbO/Si (MFIS) Structures
The Effects of Oxygen Partial Pressure on Interface States and Ferroelectric Properties of PZT/PbO/Si (MFIS) Structures
The Effects of Oxygen Partial Pressure on Interface States and Ferroelectric Properties of PZT/PbO/Si (MFIS) Structures
Park, C. H. (author) / Won, M. S. (author) / Son, Y. G. (author) / Kim, H. / Hojo, J. / Lee, S. W.
Eco-Materials Processing and Design VIII ; 1077-1080
MATERIALS SCIENCE FORUM ; 544/545
2007-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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