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    A Study of Measurement Technology for Ultra-Precision Freeform Surfaces

    New search for: Li, H. F.
    New search for: Cheung, C. F.
    New search for: Kong, L. B.
    New search for: Lee, W. B.
    New search for: To, S.
    New search for: Dong, S.
    New search for: Yao, Y.

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    A Study of Measurement Technology for Ultra-Precision Freeform Surfaces

    New search for: Li, H. F.
    New search for: Cheung, C. F.
    New search for: Kong, L. B.
    New search for: Lee, W. B.
    New search for: To, S.
    New search for: Dong, S.
    New search for: Yao, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    A Study of Measurement Technology for Ultra-Precision Freeform Surfaces

    New search for: Li, H. F.
    New search for: Cheung, C. F.
    New search for: Kong, L. B.
    New search for: Lee, W. B.
    New search for: To, S.
    New search for: Dong, S.
    New search for: Yao, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    A Study of Measurement Technology for Ultra-Precision Freeform Surfaces

    Contributors:

    Li, H. F. (author) / Cheung, C. F. (author) / Kong, L. B. (author) / Lee, W. B. (author) / To, S. (author) / Dong, S. / Yao, Y.

    Published in:

    Progress of Precision Engineering and Nano Technology Selected Papers from Proceeding of the First International Conference on Precision Engineering and Micro/Nano Technology in Asia November 12-14, 2005, Shenzhen, China ; 417-421

    KEY ENGINEERING MATERIALS ; 339

    Publication date:

    2007-01-01

    Size:

    5 pages

    ISSN:

    1013-9826

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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