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    Effects of deposition temperature and thickness on the structural properties of thermal evaporated bismuth thin films

    New search for: Kumari, L.
    New search for: Lin, S. J.
    New search for: Lin, J. H.
    New search for: Ma, Y. R.
    New search for: Lee, P. C.
    New search for: Liou, Y.

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    Effects of deposition temperature and thickness on the structural properties of thermal evaporated bismuth thin films

    New search for: Kumari, L.
    New search for: Lin, S. J.
    New search for: Lin, J. H.
    New search for: Ma, Y. R.
    New search for: Lee, P. C.
    New search for: Liou, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Effects of deposition temperature and thickness on the structural properties of thermal evaporated bismuth thin films

    New search for: Kumari, L.
    New search for: Lin, S. J.
    New search for: Lin, J. H.
    New search for: Ma, Y. R.
    New search for: Lee, P. C.
    New search for: Liou, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Effects of deposition temperature and thickness on the structural properties of thermal evaporated bismuth thin films

    Contributors:

    Kumari, L. (author) / Lin, S. J. (author) / Lin, J. H. (author) / Ma, Y. R. (author) / Lee, P. C. (author) / Liou, Y. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 253 ; 5931-5938

    Publication date:

    2007-01-01

    Size:

    8 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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