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Dopant Contrast in Semiconductors as Interpretation Challenge at Imaging by Electrons
Dopant Contrast in Semiconductors as Interpretation Challenge at Imaging by Electrons
Dopant Contrast in Semiconductors as Interpretation Challenge at Imaging by Electrons
Frank, L. (author) / Mika, F. (author) / Hovorka, M. (author) / Valdaitsev, D. (author) / Schonhense, G. (author) / Mullerova, I. (author)
MATERIALS TRANSACTIONS ; 48 ; 936-939
2007-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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