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    Determination of interface properties between micron-thick metal film and ceramic substrate using peel test

    New search for: Zhao, H.
    New search for: Wei, Y.

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    Determination of interface properties between micron-thick metal film and ceramic substrate using peel test

    New search for: Zhao, H.
    New search for: Wei, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Determination of interface properties between micron-thick metal film and ceramic substrate using peel test

    New search for: Zhao, H.
    New search for: Wei, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Determination of interface properties between micron-thick metal film and ceramic substrate using peel test

    Contributors:

    Zhao, H. (author) / Wei, Y. (author)

    Published in:

    INTERNATIONAL JOURNAL OF FRACTURE ; 144 ; 103-112

    Publication date:

    2007-01-01

    Size:

    10 pages

    ISSN:

    0376-9429

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.1126

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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