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Investigation on reliability of nanolayer-grained Ti3SiC2 via Weibull statistics

Bao, Y. W. / Zhou, Y. C. / Zhang, H. B.

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Investigation on reliability of nanolayer-grained Ti3SiC2 via Weibull statistics

Bao, Y. W. / Zhou, Y. C. / Zhang, H. B.

Investigation on reliability of nanolayer-grained Ti3SiC2 via Weibull statistics

Bao, Y. W. / Zhou, Y. C. / Zhang, H. B.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Investigation on reliability of nanolayer-grained Ti3SiC2 via Weibull statistics

Contributors:

Bao, Y. W. (author) / Zhou, Y. C. (author) / Zhang, H. B. (author)

Published in:

JOURNAL OF MATERIALS SCIENCE ; 42 ; 4470-4475

Publication date:

2007-01-01

Size:

6 pages

ISSN:

0022-2461

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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