Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    High Frequency Dielectric Permittivity Measurement of Dielectric Layer of MLCC Using Non-Contact Probe

    New search for: Kakemoto, H.
    New search for: Li, J.
    New search for: Harigai, T.
    New search for: Nam, S. M.
    New search for: Wada, S.
    New search for: Tsurumi, T.
    New search for: Katayama, K.
    New search for: Kato, K.
    New search for: Takenaka, T.
    New search for: Takata, M.
    New search for: Shinozaki, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    High Frequency Dielectric Permittivity Measurement of Dielectric Layer of MLCC Using Non-Contact Probe

    New search for: Kakemoto, H.
    New search for: Li, J.
    New search for: Harigai, T.
    New search for: Nam, S. M.
    New search for: Wada, S.
    New search for: Tsurumi, T.
    New search for: Katayama, K.
    New search for: Kato, K.
    New search for: Takenaka, T.
    New search for: Takata, M.
    New search for: Shinozaki, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    High Frequency Dielectric Permittivity Measurement of Dielectric Layer of MLCC Using Non-Contact Probe

    New search for: Kakemoto, H.
    New search for: Li, J.
    New search for: Harigai, T.
    New search for: Nam, S. M.
    New search for: Wada, S.
    New search for: Tsurumi, T.
    New search for: Katayama, K.
    New search for: Kato, K.
    New search for: Takenaka, T.
    New search for: Takata, M.
    New search for: Shinozaki, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    High Frequency Dielectric Permittivity Measurement of Dielectric Layer of MLCC Using Non-Contact Probe

    Contributors:

    Kakemoto, H. (author) / Li, J. (author) / Harigai, T. (author) / Nam, S. M. (author) / Wada, S. (author) / Tsurumi, T. (author) / Katayama, K. / Kato, K. / Takenaka, T. / Takata, M.

    Published in:

    Electroceramics in Japan X ; 243-246

    KEY ENGINEERING MATERIALS ; 350

    Publication date:

    2007-01-01

    Size:

    4 pages

    ISSN:

    1013-9826

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    MLCC METHOD OF DIELECTRIC CERAMIC COMPOSITION FOR MLCC

    LEE HEE SANG / LEE HEE SEOK / LEE DAE SIK | European Patent Office | 2018

    Free access

    High-dielectric-constant microwave dielectric ceramic for MLCC and preparation method of high-dielectric-constant microwave dielectric ceramic

    YOSHIGISHI / WANG XIAOHUI / KIM JIN-YONG et al. | European Patent Office | 2023

    Free access

    High Frequency Dielectric Mapping Using Un-Contact Probe for Dielectric Materials

    Kakemoto, H. / Nam, S. M. / Wada, S. et al. | British Library Online Contents | 2006

    Barium titanate-based X9R type high-dielectric MLCC dielectric material and preparation method thereof

    WANG FENGLIN / ZHANG WEIJUN / MAO HAIJUN et al. | European Patent Office | 2024

    Free access

    Stable dielectric material for MLCC and preparation method thereof

    LI LINGXIA / XIE JIALING / XUE KEYING et al. | European Patent Office | 2021

    Free access
    Back to top