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    Strain Measurements of Silicon Dioxide Microspecimens by Digital Imaging Processing

    New search for: Sharpe, W. N.
    New search for: Pulskamp, J.
    New search for: Gianola, D. S.
    New search for: Eberl, C.
    New search for: Polcawich, R. G.
    New search for: Thompson, R. J.

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    Strain Measurements of Silicon Dioxide Microspecimens by Digital Imaging Processing

    New search for: Sharpe, W. N.
    New search for: Pulskamp, J.
    New search for: Gianola, D. S.
    New search for: Eberl, C.
    New search for: Polcawich, R. G.
    New search for: Thompson, R. J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Strain Measurements of Silicon Dioxide Microspecimens by Digital Imaging Processing

    New search for: Sharpe, W. N.
    New search for: Pulskamp, J.
    New search for: Gianola, D. S.
    New search for: Eberl, C.
    New search for: Polcawich, R. G.
    New search for: Thompson, R. J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Strain Measurements of Silicon Dioxide Microspecimens by Digital Imaging Processing

    Contributors:

    Sharpe, W. N. (author) / Pulskamp, J. (author) / Gianola, D. S. (author) / Eberl, C. (author) / Polcawich, R. G. (author) / Thompson, R. J. (author)

    Published in:

    EXPERIMENTAL MECHANICS ; 47 ; 649-658

    Publication date:

    2007-01-01

    Size:

    10 pages

    ISSN:

    0014-4851

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.1

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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