Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Tilt of Atomic Force Microscope Cantilevers: Effect on Friction Measurements

    New search for: Wang, F.
    New search for: Zhao, X.Z.
    New search for: Zhou, Y.
    New search for: Tu, S.-T.
    New search for: Xie, X.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Tilt of Atomic Force Microscope Cantilevers: Effect on Friction Measurements

    New search for: Wang, F.
    New search for: Zhao, X.Z.
    New search for: Zhou, Y.
    New search for: Tu, S.-T.
    New search for: Xie, X.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Tilt of Atomic Force Microscope Cantilevers: Effect on Friction Measurements

    New search for: Wang, F.
    New search for: Zhao, X.Z.
    New search for: Zhou, Y.
    New search for: Tu, S.-T.
    New search for: Xie, X.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Tilt of Atomic Force Microscope Cantilevers: Effect on Friction Measurements

    Contributors:

    Wang, F. (author) / Zhao, X.Z. (author) / Zhou, Y. / Tu, S.-T. / Xie, X.

    Published in:

    Progresses in Fracture and Strength of Materials and Structures: Part 2: Selected, peer reviewed papers from the Asian Pacific Conference Fracture and Strength 2006 (APCFS'06), held at Sanya, Hainan Island, China during November 22∼25, 2006 ; 742-745

    KEY ENGINEERING MATERIALS ; 353/358

    Publication date:

    2007-01-01

    Size:

    4 pages

    ISSN:

    1013-9826

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Characterisation of the Mechanical Properties of Thin Film Cantilevers with the Atomic Force Microscope

    Drummond, C. J. / Senden, T. J. | British Library Online Contents | 1995

    Free and forced vibrations of atomic force microscope piezoelectric cantilevers considering tip-sample nonlinear interactions

    Ahmadi, Masoud / Ansari, Reza / Darvizeh, Mansour | Elsevier | 2019

    Scanning Tunneling Microscope - Atomic Force Microscope

    Masuda, H. | British Library Online Contents | 1993

    Simultaneous Atomic Imaging of Atomic Force Microscopy and Scanning Tunneling Microscopy Using Metal Coated Cantilevers

    Sawada, D. / Hirai, A. / Sugimoto, Y. et al. | British Library Online Contents | 2009

    Vibration suppression of atomic-force microscopy cantilevers covered by a piezoelectric layer with tensile force

    Korayem, M. H. / Alipour, A. / Younesian, D. | British Library Online Contents | 2018

    Back to top