Morphological and structural characterizations of CrSi2 nanometric films deposited by laser ablation: Fid-Bau Portal

Morphological and structural characterizations of CrSi2 nanometric films deposited by laser ablation

Caricato, A. P. / Leggieri, G. / Luches, A. / Romano, F. / Barucca, G. / Mengucci, P. / Mulenko, S. A.

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Morphological and structural characterizations of CrSi2 nanometric films deposited by laser ablation

Caricato, A. P. / Leggieri, G. / Luches, A. / Romano, F. / Barucca, G. / Mengucci, P. / Mulenko, S. A.

Morphological and structural characterizations of CrSi2 nanometric films deposited by laser ablation

Caricato, A. P. / Leggieri, G. / Luches, A. / Romano, F. / Barucca, G. / Mengucci, P. / Mulenko, S. A.

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Document information

Title:

Morphological and structural characterizations of CrSi2 nanometric films deposited by laser ablation

Contributors:

Caricato, A. P. (author) / Leggieri, G. (author) / Luches, A. (author) / Romano, F. (author) / Barucca, G. (author) / Mengucci, P. (author) / Mulenko, S. A. (author)

Published in:

APPLIED SURFACE SCIENCE ; 254 ; 1224-1227

Publication date:

2007-01-01

Size:

4 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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