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    Spectroscopic ellipsometric characterization of TiAlN/TiAlON/Si3N4 tandem absorber for solar selective applications

    New search for: Biswas, A.
    New search for: Bhattacharyya, D.
    New search for: Barshilia, H. C.
    New search for: Selvakumar, N.
    New search for: Rajam, K. S.

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    Spectroscopic ellipsometric characterization of TiAlN/TiAlON/Si3N4 tandem absorber for solar selective applications

    New search for: Biswas, A.
    New search for: Bhattacharyya, D.
    New search for: Barshilia, H. C.
    New search for: Selvakumar, N.
    New search for: Rajam, K. S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Spectroscopic ellipsometric characterization of TiAlN/TiAlON/Si3N4 tandem absorber for solar selective applications

    New search for: Biswas, A.
    New search for: Bhattacharyya, D.
    New search for: Barshilia, H. C.
    New search for: Selvakumar, N.
    New search for: Rajam, K. S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Spectroscopic ellipsometric characterization of TiAlN/TiAlON/Si3N4 tandem absorber for solar selective applications

    Contributors:

    Biswas, A. (author) / Bhattacharyya, D. (author) / Barshilia, H. C. (author) / Selvakumar, N. (author) / Rajam, K. S. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 254 ; 1694-1699

    Publication date:

    2008-01-01

    Size:

    6 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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