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    Wettability of Ni-V, Co-V, and Ni-Cr-V system brazing alloys on Si3N4 ceramic and interfacial reactions

    New search for: Xiong, H. P.
    New search for: Dong, W.
    New search for: Chen, B.
    New search for: Kang, Y. S.
    New search for: Kawasaki, A.
    New search for: Okamura, H.
    New search for: Watanabe, R.

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    Wettability of Ni-V, Co-V, and Ni-Cr-V system brazing alloys on Si3N4 ceramic and interfacial reactions

    New search for: Xiong, H. P.
    New search for: Dong, W.
    New search for: Chen, B.
    New search for: Kang, Y. S.
    New search for: Kawasaki, A.
    New search for: Okamura, H.
    New search for: Watanabe, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Wettability of Ni-V, Co-V, and Ni-Cr-V system brazing alloys on Si3N4 ceramic and interfacial reactions

    New search for: Xiong, H. P.
    New search for: Dong, W.
    New search for: Chen, B.
    New search for: Kang, Y. S.
    New search for: Kawasaki, A.
    New search for: Okamura, H.
    New search for: Watanabe, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Wettability of Ni-V, Co-V, and Ni-Cr-V system brazing alloys on Si3N4 ceramic and interfacial reactions

    Contributors:

    Xiong, H. P. (author) / Dong, W. (author) / Chen, B. (author) / Kang, Y. S. (author) / Kawasaki, A. (author) / Okamura, H. (author) / Watanabe, R. (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING A ; 474 ; 376-381

    Publication date:

    2008-01-01

    Size:

    6 pages

    ISSN:

    0921-5093

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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