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    Recognition of MEMS Microstructure Feature Based on Pattern Analysis and Classification

    New search for: Hu, K.
    New search for: Jiang, X.Q.
    New search for: Liu, X.J.
    New search for: Jin, G.F.
    New search for: Lee, W.B.
    New search for: Cheung, C.F.
    New search for: To, S.

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    Recognition of MEMS Microstructure Feature Based on Pattern Analysis and Classification

    New search for: Hu, K.
    New search for: Jiang, X.Q.
    New search for: Liu, X.J.
    New search for: Jin, G.F.
    New search for: Lee, W.B.
    New search for: Cheung, C.F.
    New search for: To, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Recognition of MEMS Microstructure Feature Based on Pattern Analysis and Classification

    New search for: Hu, K.
    New search for: Jiang, X.Q.
    New search for: Liu, X.J.
    New search for: Jin, G.F.
    New search for: Lee, W.B.
    New search for: Cheung, C.F.
    New search for: To, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Recognition of MEMS Microstructure Feature Based on Pattern Analysis and Classification

    Contributors:

    Hu, K. (author) / Jiang, X.Q. (author) / Liu, X.J. (author) / Jin, G.F. / Lee, W.B. / Cheung, C.F. / To, S.

    Published in:

    Advances in Optics Design and Precision Manufacturing Technologies ; 555-559

    KEY ENGINEERING MATERIALS ; 364/366

    Publication date:

    2008-01-01

    Size:

    5 pages

    ISSN:

    1013-9826

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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