Effects of the Top-Electrode Annealing on the Ferroelectric Properties of BiFeO~3 Thin Films: Fid-Bau Portal

Effects of the Top-Electrode Annealing on the Ferroelectric Properties of BiFeO~3 Thin Films

Liu, S. / Li, J. / Pan, W.

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Effects of the Top-Electrode Annealing on the Ferroelectric Properties of BiFeO~3 Thin Films

Liu, S. / Li, J. / Pan, W.

Effects of the Top-Electrode Annealing on the Ferroelectric Properties of BiFeO~3 Thin Films

Liu, S. / Li, J. / Pan, W.

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Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Effects of the Top-Electrode Annealing on the Ferroelectric Properties of BiFeO~3 Thin Films

Contributors:

Liu, S. (author) / Li, J. (author) / Pan, W. (author) / Pan, W. / Gong, J.

Published in:

High-Performance Ceramics V Part 1 ; 230-231

KEY ENGINEERING MATERIALS ; 368-372

Publication date:

2008-01-01

Size:

2 pages

ISSN:

1013-9826

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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