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    Relative fraction of sp3 bonding in boron incorporated amorphous carbon films determined by X-ray photoelectron spectroscopy

    New search for: Tan, M.
    New search for: Zhu, J.
    New search for: Han, J.
    New search for: Niu, L.
    New search for: Lu, J.
    New search for: Chen, W.

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    Relative fraction of sp3 bonding in boron incorporated amorphous carbon films determined by X-ray photoelectron spectroscopy

    New search for: Tan, M.
    New search for: Zhu, J.
    New search for: Han, J.
    New search for: Niu, L.
    New search for: Lu, J.
    New search for: Chen, W.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Relative fraction of sp3 bonding in boron incorporated amorphous carbon films determined by X-ray photoelectron spectroscopy

    New search for: Tan, M.
    New search for: Zhu, J.
    New search for: Han, J.
    New search for: Niu, L.
    New search for: Lu, J.
    New search for: Chen, W.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Relative fraction of sp3 bonding in boron incorporated amorphous carbon films determined by X-ray photoelectron spectroscopy

    Contributors:

    Tan, M. (author) / Zhu, J. (author) / Han, J. (author) / Niu, L. (author) / Lu, J. (author) / Chen, W. (author)

    Published in:

    MATERIALS RESEARCH BULLETIN ; 43 ; 1670-1678

    Publication date:

    2008-01-01

    Size:

    9 pages

    ISSN:

    0025-5408

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11 / 620

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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