Characterization and Manipulation of Boron Nanowire inside SEM: Fid-Bau Portal

Characterization and Manipulation of Boron Nanowire inside SEM

Chang, M. / Lin, C.H. / Deka, J.R.

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Characterization and Manipulation of Boron Nanowire inside SEM

Chang, M. / Lin, C.H. / Deka, J.R.

Characterization and Manipulation of Boron Nanowire inside SEM

Chang, M. / Lin, C.H. / Deka, J.R.

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Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Characterization and Manipulation of Boron Nanowire inside SEM

Contributors:

Chang, M. (author) / Lin, C.H. (author) / Deka, J.R. (author) / Gao, W. / Takaya, Y. / Gao, Y. / Krystek, M.

Published in:

Measurement Technology and Intelligent Instruments VIII ; 31-34

KEY ENGINEERING MATERIALS ; 381/382

Publication date:

2008-01-01

Size:

4 pages

ISSN:

1013-9826

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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