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    Continuous Recrystallization Phenomenon in High Purity Copper during Equal Channel Angular Pressing up to High Strain at Room Temperature

    New search for: Wang, J.T.
    New search for: Zhang, Y.
    New search for: Liu, J.Q.
    New search for: Estrin, Y.
    New search for: Maier, H.J.

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    Continuous Recrystallization Phenomenon in High Purity Copper during Equal Channel Angular Pressing up to High Strain at Room Temperature

    New search for: Wang, J.T.
    New search for: Zhang, Y.
    New search for: Liu, J.Q.
    New search for: Estrin, Y.
    New search for: Maier, H.J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Continuous Recrystallization Phenomenon in High Purity Copper during Equal Channel Angular Pressing up to High Strain at Room Temperature

    New search for: Wang, J.T.
    New search for: Zhang, Y.
    New search for: Liu, J.Q.
    New search for: Estrin, Y.
    New search for: Maier, H.J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Continuous Recrystallization Phenomenon in High Purity Copper during Equal Channel Angular Pressing up to High Strain at Room Temperature

    Contributors:

    Wang, J.T. (author) / Zhang, Y. (author) / Liu, J.Q. (author) / Estrin, Y. / Maier, H.J.

    Published in:

    Nanomaterials by Severe Plastic Deformation IV PART 2 Selected, peer reviewed papers from the 4th International Conference on Nanomaterials by Severe Plastic Deformation, Goslar, Germany, August 18-22, 2008 ; 929-937

    MATERIALS SCIENCE FORUM ; 584/586

    Publication date:

    2008-01-01

    Size:

    9 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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