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    Berkovich indentation-induced deformation behaviors of GaN thin films observed using cathodoluminescence and cross-sectional transmission electron microscopy

    New search for: Jian, S. R.

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    Berkovich indentation-induced deformation behaviors of GaN thin films observed using cathodoluminescence and cross-sectional transmission electron microscopy

    New search for: Jian, S. R.

    Access

    Access via TIB
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    Berkovich indentation-induced deformation behaviors of GaN thin films observed using cathodoluminescence and cross-sectional transmission electron microscopy

    New search for: Jian, S. R.

    Access

    Access via TIB
    Check availability in my library
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    Document information
    Title:

    Berkovich indentation-induced deformation behaviors of GaN thin films observed using cathodoluminescence and cross-sectional transmission electron microscopy

    Contributors:

    Jian, S. R. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 254 ; 6749-6753

    Publication date:

    2008-01-01

    Size:

    5 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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