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    Automatic Full Strain Field Moiré Interferometry Measurement with Nano-scale Resolution

    New search for: Chen, B.
    New search for: Basaran, C.

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    Automatic Full Strain Field Moiré Interferometry Measurement with Nano-scale Resolution

    New search for: Chen, B.
    New search for: Basaran, C.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Automatic Full Strain Field Moiré Interferometry Measurement with Nano-scale Resolution

    New search for: Chen, B.
    New search for: Basaran, C.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Automatic Full Strain Field Moiré Interferometry Measurement with Nano-scale Resolution

    Contributors:

    Chen, B. (author) / Basaran, C. (author)

    Published in:

    EXPERIMENTAL MECHANICS ; 48 ; 665-673

    Publication date:

    2008-01-01

    Size:

    9 pages

    ISSN:

    0014-4851

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.1

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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