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    Investigation for recrystallization behavior of shot peened layer on TiB2/6351Al composite using X-ray diffraction

    New search for: Luan, W.
    New search for: Jiang, C.
    New search for: Wang, H.

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    Investigation for recrystallization behavior of shot peened layer on TiB2/6351Al composite using X-ray diffraction

    New search for: Luan, W.
    New search for: Jiang, C.
    New search for: Wang, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Investigation for recrystallization behavior of shot peened layer on TiB2/6351Al composite using X-ray diffraction

    New search for: Luan, W.
    New search for: Jiang, C.
    New search for: Wang, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
    Similar titles

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    Document information
    Title:

    Investigation for recrystallization behavior of shot peened layer on TiB2/6351Al composite using X-ray diffraction

    Contributors:

    Luan, W. (author) / Jiang, C. (author) / Wang, H. (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING A ; 496 ; 36-39

    Publication date:

    2008-01-01

    Size:

    4 pages

    ISSN:

    0921-5093

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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