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    Determination of defects in 6H-SiC single crystals irradiated with 20MeV Au ions

    New search for: Gentils, A.
    New search for: Barthe, M. F.
    New search for: Thome, L.
    New search for: Behar, M.

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    Determination of defects in 6H-SiC single crystals irradiated with 20MeV Au ions

    New search for: Gentils, A.
    New search for: Barthe, M. F.
    New search for: Thome, L.
    New search for: Behar, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Determination of defects in 6H-SiC single crystals irradiated with 20MeV Au ions

    New search for: Gentils, A.
    New search for: Barthe, M. F.
    New search for: Thome, L.
    New search for: Behar, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Determination of defects in 6H-SiC single crystals irradiated with 20MeV Au ions

    Contributors:

    Gentils, A. (author) / Barthe, M. F. (author) / Thome, L. (author) / Behar, M. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 255 ; 78-80

    Publication date:

    2008-01-01

    Size:

    3 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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