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    Grain Orientation Mapping of Polycrystalline Organic Semiconductor Films by Transverse Shear Microscopy

    New search for: Kalihari, V.
    New search for: Tadmor, E. B.
    New search for: Haugstad, G.
    New search for: Frisbie, C. D.

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    Grain Orientation Mapping of Polycrystalline Organic Semiconductor Films by Transverse Shear Microscopy

    New search for: Kalihari, V.
    New search for: Tadmor, E. B.
    New search for: Haugstad, G.
    New search for: Frisbie, C. D.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Grain Orientation Mapping of Polycrystalline Organic Semiconductor Films by Transverse Shear Microscopy

    New search for: Kalihari, V.
    New search for: Tadmor, E. B.
    New search for: Haugstad, G.
    New search for: Frisbie, C. D.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
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    Document information
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    Document information
    Title:

    Grain Orientation Mapping of Polycrystalline Organic Semiconductor Films by Transverse Shear Microscopy

    Contributors:

    Kalihari, V. (author) / Tadmor, E. B. (author) / Haugstad, G. (author) / Frisbie, C. D. (author)

    Published in:

    ADVANCED MATERIALS -DEERFIELD BEACH THEN WEINHEIM- ; 20 ; 4033-4039

    Publication date:

    2008-01-01

    Size:

    7 pages

    ISSN:

    0935-9648

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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