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Process Quality Collaborative Tracing-Back and Close Loop in CIMS

Zhao, L.P. / Yao, Y.Y.

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Process Quality Collaborative Tracing-Back and Close Loop in CIMS

Zhao, L.P. / Yao, Y.Y.

Process Quality Collaborative Tracing-Back and Close Loop in CIMS

Zhao, L.P. / Yao, Y.Y.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Process Quality Collaborative Tracing-Back and Close Loop in CIMS

Contributors:

Zhao, L.P. (author) / Yao, Y.Y. (author) / Wang, G. / Wang, H. / Liu, J.

Published in:

Manufacturing Automation Technology Selected Papers from Proceeding of the 13th Conference of China University Society on Manufacturing Automation July 22-24, 2008, Harbin, China ; 419-423

KEY ENGINEERING MATERIALS ; 392/394

Publication date:

2009-01-01

Size:

5 pages

ISSN:

1013-9826

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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