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Molecular dynamics study of scratching velocity dependency in AFM-based nanometric scratching process

Zhang, J. / Sun, T. / Yan, Y. / Liang, Y.

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Molecular dynamics study of scratching velocity dependency in AFM-based nanometric scratching process

Zhang, J. / Sun, T. / Yan, Y. / Liang, Y.

Molecular dynamics study of scratching velocity dependency in AFM-based nanometric scratching process

Zhang, J. / Sun, T. / Yan, Y. / Liang, Y.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

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Document information

Title:

Molecular dynamics study of scratching velocity dependency in AFM-based nanometric scratching process

Contributors:

Zhang, J. (author) / Sun, T. (author) / Yan, Y. (author) / Liang, Y. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING A ; 505 ; 65-69

Publication date:

2009-01-01

Size:

5 pages

ISSN:

0921-5093

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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