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    Phase Inhomogeneity and Electrical Characteristics of Nickel Silicide Schottky Contacts Formed on 4H-SiC

    New search for: Nikitina, L.P.
    New search for: Vassilevski, K.V.
    New search for: Horsfall, A.B.
    New search for: Wright, N.G.
    New search for: O Neill, A.G.
    New search for: Ray, S.K.
    New search for: Johnson, C.M.

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    Phase Inhomogeneity and Electrical Characteristics of Nickel Silicide Schottky Contacts Formed on 4H-SiC

    New search for: Nikitina, L.P.
    New search for: Vassilevski, K.V.
    New search for: Horsfall, A.B.
    New search for: Wright, N.G.
    New search for: O Neill, A.G.
    New search for: Ray, S.K.
    New search for: Johnson, C.M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Phase Inhomogeneity and Electrical Characteristics of Nickel Silicide Schottky Contacts Formed on 4H-SiC

    New search for: Nikitina, L.P.
    New search for: Vassilevski, K.V.
    New search for: Horsfall, A.B.
    New search for: Wright, N.G.
    New search for: O Neill, A.G.
    New search for: Ray, S.K.
    New search for: Johnson, C.M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Phase Inhomogeneity and Electrical Characteristics of Nickel Silicide Schottky Contacts Formed on 4H-SiC

    Contributors:

    Nikitina, L.P. (author) / Vassilevski, K.V. (author) / Horsfall, A.B. (author) / Wright, N.G. (author) / O Neill, A.G. (author) / Ray, S.K. (author) / Johnson, C.M. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 615/617 ; 577-580

    Publication date:

    2009-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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