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    Reverse analysis of nano-indentation using different representative strains and residual indentation profiles

    New search for: Lee, J.
    New search for: Lee, C.
    New search for: Kim, B.

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    Reverse analysis of nano-indentation using different representative strains and residual indentation profiles

    New search for: Lee, J.
    New search for: Lee, C.
    New search for: Kim, B.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Reverse analysis of nano-indentation using different representative strains and residual indentation profiles

    New search for: Lee, J.
    New search for: Lee, C.
    New search for: Kim, B.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Reverse analysis of nano-indentation using different representative strains and residual indentation profiles

    Contributors:

    Lee, J. (author) / Lee, C. (author) / Kim, B. (author)

    Published in:

    MATERIALS AND DESIGN -REIGATE- ; 30 ; 3395-3404

    Publication date:

    2009-01-01

    Size:

    10 pages

    ISSN:

    0264-1275

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.0042

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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