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    Development of Multiscale Simulation System for Nano-Processes

    New search for: Chen, H.W.
    New search for: Tieu, A.K.
    New search for: Hagiwara, I.
    New search for: Rui, F.
    New search for: Lihong, Q.
    New search for: Huawei, C.
    New search for: Akio, O.
    New search for: Hiroshi, U.
    New search for: Katsuhiko, S.

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    Development of Multiscale Simulation System for Nano-Processes

    New search for: Chen, H.W.
    New search for: Tieu, A.K.
    New search for: Hagiwara, I.
    New search for: Rui, F.
    New search for: Lihong, Q.
    New search for: Huawei, C.
    New search for: Akio, O.
    New search for: Hiroshi, U.
    New search for: Katsuhiko, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Development of Multiscale Simulation System for Nano-Processes

    New search for: Chen, H.W.
    New search for: Tieu, A.K.
    New search for: Hagiwara, I.
    New search for: Rui, F.
    New search for: Lihong, Q.
    New search for: Huawei, C.
    New search for: Akio, O.
    New search for: Hiroshi, U.
    New search for: Katsuhiko, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Development of Multiscale Simulation System for Nano-Processes

    Contributors:

    Chen, H.W. (author) / Tieu, A.K. (author) / Hagiwara, I. (author) / Rui, F. / Lihong, Q. / Huawei, C. / Akio, O. / Hiroshi, U. / Katsuhiko, S.

    Published in:

    Progress of Machining Technology ; 452-455

    KEY ENGINEERING MATERIALS ; 407/408

    Publication date:

    2009-01-01

    Size:

    4 pages

    ISSN:

    1013-9826

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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