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    Reliability Life Prediction of VFD by Constant Temperature Stress Accelerated Life Tests and Maximum Likelihood Estimation

    New search for: Zhang, J.-P.
    New search for: Wang, R.-T.

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    Reliability Life Prediction of VFD by Constant Temperature Stress Accelerated Life Tests and Maximum Likelihood Estimation

    New search for: Zhang, J.-P.
    New search for: Wang, R.-T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Reliability Life Prediction of VFD by Constant Temperature Stress Accelerated Life Tests and Maximum Likelihood Estimation

    New search for: Zhang, J.-P.
    New search for: Wang, R.-T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Document information
    Title:

    Reliability Life Prediction of VFD by Constant Temperature Stress Accelerated Life Tests and Maximum Likelihood Estimation

    Contributors:

    Zhang, J.-P. (author) / Wang, R.-T. (author)

    Published in:

    JOURNAL OF TESTING AND EVALUATION ; 37 ; 316-320

    Publication date:

    2009-01-01

    Size:

    5 pages

    ISSN:

    0090-3973

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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