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    Effect of film thickness on ferroelectric domain structure and properties of Pb(Zr0.35Ti0.65)O3/SrRuO3/SrTiO3 heterostructures

    New search for: Morioka, H.
    New search for: Saito, K.
    New search for: Yokoyama, S.
    New search for: Oikawa, T.
    New search for: Kurosawa, T.
    New search for: Funakubo, H.

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    Effect of film thickness on ferroelectric domain structure and properties of Pb(Zr0.35Ti0.65)O3/SrRuO3/SrTiO3 heterostructures

    New search for: Morioka, H.
    New search for: Saito, K.
    New search for: Yokoyama, S.
    New search for: Oikawa, T.
    New search for: Kurosawa, T.
    New search for: Funakubo, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Effect of film thickness on ferroelectric domain structure and properties of Pb(Zr0.35Ti0.65)O3/SrRuO3/SrTiO3 heterostructures

    New search for: Morioka, H.
    New search for: Saito, K.
    New search for: Yokoyama, S.
    New search for: Oikawa, T.
    New search for: Kurosawa, T.
    New search for: Funakubo, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Effect of film thickness on ferroelectric domain structure and properties of Pb(Zr0.35Ti0.65)O3/SrRuO3/SrTiO3 heterostructures

    Contributors:

    Morioka, H. (author) / Saito, K. (author) / Yokoyama, S. (author) / Oikawa, T. (author) / Kurosawa, T. (author) / Funakubo, H. (author)

    Published in:

    JOURNAL OF MATERIALS SCIENCE ; 44 ; 5318-5324

    Publication date:

    2009-01-01

    Size:

    7 pages

    ISSN:

    0022-2461

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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